Embedded
Functional Safety for Machine Controls
When implementing technical protective measures (also referred to as “safeguards”) from the hierarchy...
Time Domain Scans Vs. Stepped Frequency Scans
Rohde and Schwarz launched with the RandS ESU the world's first commercial EMI test receiver capable...
The Efficiency Challenge
With the digital expansion over the past few decades, new requirements for data centers to store, transmit,...
Fundamentals of Reliable Flash Storage: An Introduction to Security
Not a single day passes without major news of data breaches. Whether it is database theft or taking control...
PRACTICAL LOW POWER CPLD DESIGN
Any engineer involved with portable or handheld products knows that minimizing power consumption is an...
Realtime Deembedding with the R&S®RTP
Deembedding, often a necessary and complex task, is made easier with an integrated hardware and software...
Considerations for Building Out Your Connected Device Strategy
The Internet of Things (IoT) has nearly eclipsed the splendor of “big data”—in fact, it's enveloping...
High-Speed SERDES Interfaces In High Value FPGAs
Lattice Semiconductor has introduced two low cost FPGA families with SERDES, the LatticeECP2M, introduced...
Virtium TuffDrive® PATA SSDs
Virtium TuffDrive Parallel ATA (PATA) solid state drives (SSDs) are direct replacements for legacy PATA...
The Ultimate Guide to ECU Production Test Systems
Modern vehicles can contain over 100 ECUs controlling everything from the drivetrain to the ADAS systems....
1:2 and 1:1 MIPI DSI Display Interface Bridge Soft IP
As the industry evolves, bandwidth requirements have exceeded what display manufacturers are capable...
Sign up for Electronic Pro Tech Publish Hub
As a subscriber you will receive alerts and free access to our constantly updated library of white papers, analyst reports, case studies, web seminars and solution reports.