Components
DESIGNING FOR LOW POWER
Power consumption is becoming an increasingly important variable when it comes to calculating OPEX and...
5G NR‑V2X For Enhanced Automotive Communications
This white paper provides a technology deep dive into the architecture, protocols and physical layer...
The Ultimate Guide to ECU Production Test Systems
Modern vehicles can contain over 100 ECUs controlling everything from the drivetrain to the ADAS systems....
MachXO PLDs in System Control Designs
Temperature measurement, current monitoring, power supply sequencing, fan control and fault logging are...
System Level Verification and Debug of DDR3/4 Memory Designs
This application note provides an introduction to the DDR memory technology and explains common challenges,...
ENHANCING LONG-TERM RELIABILITY WITH COPPER LEADFRAMES
One of the points to consider when selecting a semiconductor device is the package reliability, relative...
POLYMER CAPACITORS VS. MLCCS
Most often capacitor selection to the uninformed seems like a simple choice but the demands, challenges...
Accurate Test Fixture Characterization and Deembedding
For measurements of non-connectorized devices, test fixtures, probes or other structures are used to...
Device Security for the IIoT
The Industrial Internet of Things (IIoT) is driving investment in new technology and manufacturing methodologies...
CT Scanner
Recently there has been growing demand for improvements in image resolution and analytical capability...
Sign up for Electronic Pro Tech Publish Hub
As a subscriber you will receive alerts and free access to our constantly updated library of white papers, analyst reports, case studies, web seminars and solution reports.