THE EFFECT OF SURFACE OXIDATION ON IHLP INDUCTOR PERFORMANCE AND RELIABILITY
Under certain environmental conditions such as high moisture and elevated temperatures or in the presence of ionic contamination, a slight amount of surface oxidation has been found to form on the surface of a small percentage of IHLP inductors.
The following report contains construction details, the results of analysis, and a summary of the reliability testing performed regarding the formation of surface oxidation.
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Related Categories: Components, Inductors, Semiconductors
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